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Functional Test

black box type testing via interface level inputs and resulting output analysis.

See Also: Functional ATE, Functional Test Systems, Interoperability Test, End of Line


Showing results: 301 - 315 of 696 items found.

  • PCI Precision Resistor Card 6-Channel, 2.5Ω To 773kΩ

    50-297-043 - Pickering Interfaces Ltd.

    The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.

  • PCI Precision Resistor Card 6-Channel, 3Ω To 11.4MΩ

    50-297-053 - Pickering Interfaces Ltd.

    The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.

  • PCI Precision Resistor Card 4-Channel, 2Ω To 52.4kΩ

    50-297-133 - Pickering Interfaces Ltd.

    The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.

  • Digital I/O PCI Card

    GC5050 - Terotest Systems Ltd.

    The GC5050 is a high speed Dynamic Digital I/O card that provides capabilities comparable to high speed I/O products found in large functional test systems. The card shares an identical architecture with the GX5050, a 6U PXI card. Both have the ability to operate independently of the host computer when in the RUN mode.

  • Modular Test System

    DMT - UNITES Systems a.s.

    The DMT Tester is a modular test system that allows rapid measurement of electrical and non-electrical parameters of functional units. The system also allows basic ICT measurement with optional accessories. It is conceived as modular, with the possibility of integrating a wide range of own and external instruments. The DMT tester is controlled by its own SCADUS software.

  • Processor-Controlled Test (PCT)

    ScanWorks® Processor-Controlled Test - ASSET InterTech, Inc.

    Embedded in that CPU on your circuit board are the instruments that are critical for overcoming today's design challenges. Given the complexity of board designs and chips, you need access to this on-chip technology to diagnose, debug and test your designs. One of the tools that makes up the ScanWorks platform for embedded instruments is Processor-Controlled Test (PCT). It takes advantage of the CPU's debug port for access to the circuit board so it can perform board debug, device initialization, at-speed functional test with structural diagnostics and much more.

  • PCB Test Fixtures

    EverythingPCB

    ATE, ICT, semiautomatic & manual electronic test fixtures, PCB test fixtures, cable test fixture, wiring harness test fixtures, dedicated test fixtures, functional test fixtures, electronic test fixture programming. PADS Schematic capture, circuit board layout, PCB design prototype, solder paste stencils, X-Y coordinate data, B.O.M. maintenance, and manufacturing documentation, Gerber data.

  • Pilot Static Test Set

    ADTS-3300JS - TestVonics, Inc.

    TestVonics™ ADTS-3300JS Test Set is a portable, high precision, dual channel air data pressure management system. This tester is designed to calibrate, test and troubleshoot air data instrumentation and aircraft pitot-static systems. The test set has been designed with functional and reliability features highly suited to withstand the harsh environmental and demanding conditions of the flight line environment, especially for military end users. The test set is designed for testing a wide range of commercial and military aircraft, both rotary and fixed wing. The ADTS-3300JS accuracy complies with standards for RVSM and is designed to replace the TTU-205 test set.

  • Test Solutions Services

    Spinnaker Contract Manufacturing, Inc.

    As standard practice, all of our SMT assemblies are washed and tested through our Automated Optical Inspection and pass through our stringent internal QA/QC policies. In Cables and Wire Harnesses, pretests, such as pull tests and crimp type tests, are performed on all builds before being tested for continuity, hi-pot, shorts and mis-wires, to name a few. Our electromechanical assemblies are capable of receiving full functional testing through custom test fixtures and RF test. Some RF tests include Gain/Loss, Frequency Response, VSWR (Voltage Standing Wave Ratio), Inter-Modulation Distortion and Output Power.

  • Line Automation Equipment

    5000 Series In-line Handler - Circuit Check, Inc.

    The Circuit Check 5000 Series In-line Handler is an integrated inline solution that combines automation, fixturing and measurement hardware in addition to other in-line PCBA probe based test stations, while adding a standardized quick change fixture interface. The 5000 series in-line is a unified solution that is software and hardware agnostic, enabling adaptability to a variety of off-the-shelf lower cost ICT, flash and functional test software and hardware.

  • GUI Tester

    Squish - froglogic GmbH

    Testing the user interface of today's applications is a very complex and error-prone task. Automating this task is challenging, but approached correctly very rewarding. Squish is the leading cross-platform/cross-technology GUI test automation tool for functional GUI regression tests. Many companies in all kinds of industries all over the world use Squish to drastically cut down the time spent on GUI testing software releases while increasing the quality of their applications.

  • PE/ Ground, Insulation Resistance Tester

    Handheld - Schleich Gmbh

    The safety testers of the Handheld class are used to measure PE/ Ground resistances, insulation resistances and to perform a simple functional test. The small and sturdy universal testers are intended for standard-compliant safety tests in workshops and production as well as for mobile operation during repair, installation, service and more.

  • Entry Level OTDR

    palmOTDR-S120 Series - ShinewayTech

    ● The cost effective and the fully functional OTDR ● Graphic display of test results PC Software Download ● Quick start: <5 seconds USB Driver Download ● Perfect user interface, handheld & lightweight (1kg) ● Hotkeys: Easy to use, push-and-test ● 1000 test records storage ● Bellcore file format (.sor) ● PC software for batch data processing ● USB data interface, driver-free ● Multiple languages: EN/DE/IT/FR/ES/PT/RU/KR/VN/CN etc. ● 10 hours continuous operation with battery ● Dust-shock proof (2m drop test)

  • Advanced Circuit Card Automated Test

    ACCAT - Huntron

    The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.

  • Memory Test System

    T5230 - Advantest Corp.

    T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.

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